 |
Beam position
monitoring for storage rings and synchrotrons |
|
I-V characteristic
measurement of organic thin film devices |
|
Gate leakage current measurement of devices such as
field-effect transistors (FET) and insulated-gate
bipolar transistors (IGBT)
|
|
Detection of
tunneling current of scanning tunneling microscopes
(STM) |
|
Detection of
conductive probe current for atomic force microscope
(AFM) current measurement |
|
As a preamplifier
for a lock-in amplifier |
