Easy to
Conduct Various Specification Tests and Simulations.
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Low Frequency
Immunity Test |
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Standard Name
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Test
Name |
IEC 61000-4-11:2004
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Voltage dips, short
interruptions,
voltage variations
*1
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IEC
61000-4-13:2002 +A1:2009
+A2:2015 |
Harmonics combination
(Flat curve) |
Harmonics combination
(Overswing) |
Sweep in frequency
*2
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Individual harmonics
*2
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Interharmonics *2
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Meister curve *2
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IEC 61000-4-14:1999 + A1:2001 + A2:2009
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Voltage fluctuation
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IEC 61000-4-27:2000 +
A1:2009 |
Unbalance*3
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IEC 61000-4-28:1999 +
A1:2001 + A2:2009 |
Variation of power
frequency |
IEC 61000-4-29:2000
|
Voltage dips, short
interruptions,
voltage variations on d.c. input power port*3
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IEC 61000-4-34:2005
+A1:2009 |
Voltage dips, short
interruptions,
voltage variations for equipment with input
current more than 16A per phase*1
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Other
tests |
Abrupt voltage and/or
phase change |
Phase unbalance in
single-phase
three-wire systems and three-phase systems |
Arbitrary waveforms
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*1
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Preliminary tests can be conducted
with ES0406D. In the case of conformance tests, the
following products are required. |
[ IEC61000-4-11 ]
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[ IEC61000-4-34 ]
Custom-made voltage dip simulators are required.
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*2
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In the case of single-phase, a 2-channel
function generator WF1974or WF1948 is required.
In the case of three-phase, three WF1974s or WF1948s are
required. |
*3
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Preliminary tests can be conducted with ES0406D
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Immunity Test Software
ES0406D (option) |
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This is application software for ES
series to perform low frequency immunity tests. With this
software, complicated tests can be conducted easily. |
Model
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Description
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ES0406D
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Immunity
Test Software |
ES0406D-U
|
Immunity
Test Software (Upgrade)
*
Upgraded software for ES0406C
users
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menu
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Remote control function allows you
to set voltage/frequency, switch range, and turn on/off
output. |
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Arbitrary waveforms can be
edited/created. The waveform data retrieved from digital
oscilloscopes can be loaded as a text file. |
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The test result report creating
function allows you to output the results of tests into a
file. |
* |
Peripheral cables and parts other than ES series,
ES0406D, and PC may be needed, depending on the
specification
test. Contact us for details. |
Remote controller
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IEC61000-4-11 |
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Voltage dips, short interruptions and
voltage variations
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IEC61000-4-13 |
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Harmonic cmbination test (flat curve)
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Harmonic combination test (over swing)
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Interharmonics
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Meister curve
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IEC61000-4-14
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IEC61000-4-27
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Voltage fluctuation
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Unbalance
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IEC61000-4-28
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IEC61000-4-29
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Variation of power frquency
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Voltage dips, short interruptions and
voltage variations on d.c. input power port
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IEC61000-4-34
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Voltage dips, short interruptions and
voltage variations(>16A)
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Out
of standard |
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Abrupt change in phase and voltage
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Unbalance in single-phase three-wire
systems and three-phase systems
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Arbitrary waveforms
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HARDWARE REQUIREMENTS
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CPU : 1.6 GHz or higher
Memory : 1 GB (32-bit) / 2 GB (64-bit) or
higher
Hard disk space : 4 GB or higher
Display : 1024閿燂拷768 pixels or more ; 256 colors
or more
OS : Windows 7 (32-bit, 64-bit), 8.1 (32-bit,
64-bit), 10 (32-bit, 64-bit)
English
or Japanese Language Edition (Microsoft)
Disk drive : CD-ROM drive
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GPIB Interface (Use one of
the followings)
PCIe-GPIB board, PCIe-GPIB+board,
USB-GPIB-B/HS+ (All by National Instruments)
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Other
Specifications Tests
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Standard
Name |
Test Name
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IEC 61000-3-2 |
Harmonic current
emissions(≤16A) |
JIS C 61000-3-2 |
Harmonic current
emissions(≤20A) |
IEC 61000-3-12 |
Harmonic current
emissions(16A to 75A) |
IEC 61000-3-3 |
Voltage changes,
Voltage fluctuations, Flicker (≤16A) |
IEC 61000-3-11 |
Voltage changes,
Voltage fluctuations, Flicker (≤75A) |
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*Ask us for testing systems for above standards.
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•JIS standard test •UL standard test •JEIDA standard test •JASO standard test •Lloyd's standard test •RTCA standard test •Tests on system
interconnection protection system of small photovoltaic cell
power generation systems •
Various in-house tests
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